IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accelerated aging test to determine the replacement criterion of distribution surge arresters

2001 IEEE/PES Transmission and Distribution Conference and Exposition

Author(s): Ju-yong Kim ; Chan-young Kim ; Il-keun Song ; Jae-duk Moon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Atlanta, GA, USA, USA
Conference Date: 2 November 2001
Volume: 2
Page Count: 4
ISBN (Paper): 0-7803-7285-9
DOI: 10.1109/TDC.2001.971339
Regular:

This paper provides the results of accelerated aging test of 18 kV ZnO surge arresters to investigate the leakage current characteristics. It was impossible to establish the replacement criterion... View More

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