IEEE - Institute of Electrical and Electronics Engineers, Inc. - A wavelet neural network framework for diagnostics of complex engineered systems

Proceedings of the 2001 IEEE International Symposium on Intelligent Control (ISIC'01)

Author(s): G. Vachtsevanos ; Peng Wang ; J. Echauz
Sponsor(s): IEEE Control Syst. Soc. (CSS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Mexico City, Mexico, Mexico
Conference Date: 5 September 2001
Page Count: 6
Page(s): 79 - 84
ISBN (Paper): 0-7803-6722-7
ISSN (Paper): 2158-9860
DOI: 10.1109/ISIC.2001.971488
Regular:

This paper introduces a new model-free diagnostic methodology to detect and identify machine failures and product defects. The basic module of the methodology is a novel multidimensional wavelet... View More

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