IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new system for online quantitative evaluation of optical see-through augmentation

Proceedings IEEE and ACM International Symposium on Augmented Reality

Author(s): E. McGarrity ; Y. Genc ; M. Tuceryan ; C. Owen ; N. Navab
Sponsor(s): Siemens Crop. Res.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: New York, NY, USA, USA
Conference Date: 29 October 2001
Page Count: 10
Page(s): 157 - 166
ISBN (Paper): 0-7695-1375-1
DOI: 10.1109/ISAR.2001.970525
Regular:

A crucial aspect in the implementation of an augmented reality (AR) system is determining its accuracy. The accuracy of a system determines the applications it can be used for. The aim of our... View More

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