IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transmission line with a teed circuit

Proceedings of Power Engineering Society Summer Meeting

Author(s): Sang-Hee Kang ; Seung-Jae Lee ; Young-Jin Kwon ; Yong-Cheol Kang
Sponsor(s): Power Eng. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Vancouver, BC, Canada, Canada
Conference Date: 15 July 2001
Volume: 2
Page Count: 6
ISBN (Paper): 0-7803-7173-9
DOI: 10.1109/PESS.2001.970178
Regular:

This paper presents a fault location algorithm for single-phase-to-ground faults on the teed circuit of a parallel transmission line. This algorithm uses only local end voltage and current... View More

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