IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measures of ruggedness using fuzzy-rough sets and fractals: applications in medical time series

Proceedings of IEEE International Conference on Systems, Man & Cybernetics

Author(s): M. Sarkar
Sponsor(s): Raytheon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Tucson, AZ, USA, USA
Conference Date: 7 October 2001
Volume: 3
Page Count: 6
ISBN (Paper): 0-7803-7087-2
ISSN (Paper): 1062-922X
DOI: 10.1109/ICSMC.2001.973498
Regular:

This paper attempts to characterize the medical time series by quantifying the ruggedness of the time series. The presence of two close data points on the time axis implies that these points are... View More

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