IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metrics for rating the "level" of new product development activity (for mass and batch produced products)

Proceedings of IEEE Conference on Management of Innovation and Technology

Author(s): Bauly, J.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Singapore
Conference Date: 12 November 2000
Volume: 1
ISBN (Paper): 0-7803-6652-2
DOI: 10.1109/ICMIT.2000.917380
Regular:

Companies, as well as government departments and other institutions, may want to measure the new product development (NPD) activity going on in companies. This is to help them judge the... View More

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