IEEE - Institute of Electrical and Electronics Engineers, Inc. - Current ratios: a self-scaling technique for production IDDQ testing

Proceedings International Test Conference 2000

Author(s): Maxwell, P. ; O'Neill, P. ; Aitken, R. ; Dudley, R. ; Jaarsma, N. ; Quach, M. ; Wiseman, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Atlantic City, NJ, USA
Conference Date: 5 October 2000
Page(s): 1,148 - 1,156
ISBN (Paper): 0-7803-6546-1
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2000.894324
Regular:

The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describes a method of... View More

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