IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computer aided type test system for electric machine

Proceedings of 3rd International Conference on Power Electronics and Motion Control

Author(s): Wenjin Dai ; Longquan Xu ; Jingming Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Beijing, China
Conference Date: 15 August 2000
Volume: 3
ISBN (Paper): 7-80003-464-X
DOI: 10.1109/IPEMC.2000.883080
Regular:

A microcomputer is adopted as the measure and control center of a computer-aided type test system. This paper introduces the structure and principle of the system and emphasises the untouched... View More

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