IEEE - Institute of Electrical and Electronics Engineers, Inc. - Joint maximum likelihood approach in overloaded array processing

Vehicular Technology Conference Fall 2000. IEEE VTS Fall VTC2000. 52nd Vehicular Technology Conference

Author(s): Bayram, S. ; Hicks, J.H. ; Boyle, R.J. ; Reed, J.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Boston, MA, USA
Conference Date: 24 September 2000
Volume: 1
ISBN (Paper): 0-7803-6507-0
ISSN (Paper): 1090-3038
DOI: 10.1109/VETECF.2000.886683
Regular:

We demonstrate that, signal extraction in overloaded environments is achieved by employing a nonlinear maximum-likelihood detector. We define the overloaded interference scenario as one where the... View More

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