IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of the level crossing rate and average fade duration of Rayleigh, Rice and Nakagami fading models with mobile channel data

Vehicular Technology Conference Fall 2000. IEEE VTS Fall VTC2000. 52nd Vehicular Technology Conference

Author(s): Abdi, A. ; Wills, K. ; Barger, H.A. ; Alouini, M.-S. ; Kaveh, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Boston, MA, USA
Conference Date: 24 September 2000
Volume: 4
ISBN (Paper): 0-7803-6507-0
ISSN (Paper): 1090-3038
DOI: 10.1109/VETECF.2000.886139
Regular:

Level crossing rate (LCR) and average fade duration (AFD) of the signal envelope are two important second-order channel statistics, which convey useful information about the dynamic temporal... View More

Advertisement