IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of swarming pulsive micro discharge on the tree degradation

2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Kawakubo, N. ; Ehara, Y. ; Kishida, H. ; Ito, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Victoria, BC, Canada, Canada
Conference Date: 15 October 2000
Volume: 1
ISBN (Paper): 0-7803-6413-9
DOI: 10.1109/CEIDP.2000.885292
Regular:

An experimental investigation has been performed to analyze influence of swarming pulsive micro discharge (SPMD) on tree degradation process. The discharge magnitude and luminous image at several... View More

Advertisement