IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterizing HV XLPE cables by electrical, chemical and microstructural measurements on cable peeling: effects of surface roughness, thermal treatment and peeling location

2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Dissado, L.A. ; Fothergill, J.C. ; See, A. ; Stevens, G.C. ; Markey, L. ; Laurent, C. ; Teyssedre, G. ; Nilsson, U.H. ; Platbrood, G. ; Montanari, G.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Victoria, BC, Canada, Canada
Conference Date: 15 October 2000
Volume: 1
ISBN (Paper): 0-7803-6413-9
DOI: 10.1109/CEIDP.2000.885246
Regular:

Characterization of the electrical, chemical, and microstructural properties of high voltage cables was the first step of the European project "ARTEMIS", which has the aim of investigating... View More

Advertisement