IEEE - Institute of Electrical and Electronics Engineers, Inc. - Behaviour of the metal-oxide-fluid-interface

2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Julliard, Y. ; Kist, K. ; Badent, R. ; Schwab, A.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Victoria, BC, Canada, Canada
Conference Date: 15 October 2000
Volume: 2
ISBN (Paper): 0-7803-6413-9
DOI: 10.1109/CEIDP.2000.884074
Regular:

Surface phenomena at electrodes play a major role in streamer inception. Metal-electrodes are always covered with oxide-layers, changing the electrical and chemical properties of the... View More

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