IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel HV system for multi specimens aging tests under partial discharges and temperature

2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Candela, R. ; Romano, P. ; Schifani, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Victoria, BC, Canada, Canada
Conference Date: 15 October 2000
Volume: 2
ISBN (Paper): 0-7803-6413-9
DOI: 10.1109/CEIDP.2000.884062
Regular:

In this paper a novel high voltage (HV) system for testing five specimens in parallel under different combinations of voltage and temperature is presented. When partial discharges (PD) are... View More

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