IEEE - Institute of Electrical and Electronics Engineers, Inc. - Conduction current measurements on polycarbonates subjected to electrical and thermal stress

2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Beyer, J. ; Morshuis, P.H.F. ; Smit, J.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Victoria, BC, Canada, Canada
Conference Date: 15 October 2000
Volume: 2
ISBN (Paper): 0-7803-6413-9
DOI: 10.1109/CEIDP.2000.884035
Regular:

Results of conduction current measurements on Polycarbonate samples which underwent simultaneous electrical and thermal aging are reported. By recording the conduction current for different values... View More

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