IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate field computation of needle-plane gaps using an optimized charge simulation method

2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

Author(s): Abouelsaad, M.M. ; El Bahy, M.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Victoria, BC, Canada, Canada
Conference Date: 15 October 2000
Volume: 2
ISBN (Paper): 0-7803-6413-9
DOI: 10.1109/CEIDP.2000.884009
Regular:

A new approach for the computation of electric field distributions of needle-plane gaps is, here described. The approach relies on the charge simulation method (CSM) coupled with genetic... View More

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