IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bridging the gap [between low-cost general purpose electronic test equipment and high cost ATE]

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Webb, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 614 - 620
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885648
Regular:

This paper takes a look at some of the more common methods being used for circuit card test and repair. Examining the high and low end techniques, prepares the way to explore mid-range... View More

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