IEEE - Institute of Electrical and Electronics Engineers, Inc. - Designing a parallel, distributed test system

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Starkloff, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 564 - 567
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885641
Regular:

The increasing use of parallel architectures and networking technologies has enabled test systems to break free from their traditional structure. Today's systems run multiple parallel tasks,... View More

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