IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new bridging fault model for more accurate fault behavior

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Emmert, J.M. ; Stroud, C.E. ; Bailey, J.R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 481 - 485
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885628
Regular:

We describe a new bridging fault model which more accurately simulates the behavior of bridging faults that have been observed as a result of manufacturing fabrication defects in tightly packed... View More

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