IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulation-based techniques for calculating fault resolution and false removal statistics

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Gould, E. ; Hartop, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 465 - 480
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885627
Regular:

This paper discusses the use of diagnostic simulations to generate the Fault Resolution metric for a system or equipment. Simulation-based calculations are free of some of the biases that inhere... View More

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