IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test vector compression via statistical coding and dynamic compaction

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Mom Eng Ng ; Touba, N.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 348 - 354
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885613
Regular:

This paper addresses the problem of increasingly longer test times and greater test data storage requirements for integrated circuits. A new compression/decompression technique is proposed... View More

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