IEEE - Institute of Electrical and Electronics Engineers, Inc. - Migration of legacy test programs to modern programming environments

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Salopek, P.R. ; Timcho, T.J. ; Barnishan, W.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 217 - 222
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885594
Regular:

As we prepare to enter the new millennium, very valuable software programs written decades ago have become antiquated as new hardware has been developed and as software theories and management... View More

Advertisement