IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nanotechnology-based molecular test equipment (MTE) for circuit board test

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Wright, R.G. ; Zgol, M. ; Kirkland, L.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 129 - 134
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885579
Regular:

This paper describes original research efforts in the design, simulation, and development of nanotechnology-based molecular test equipment (MTE). This is a research effort for testing... View More

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