IEEE - Institute of Electrical and Electronics Engineers, Inc. - Next generation functional test program development system

2000 IEEE Autotestcon Proceedings. AUTOTESTCON 2000. IEEE Systems Readiness Technology Conference. Future Sustainment for Military and Aerospace

Author(s): Rolince, D. ; Giles, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Anaheim, CA, USA, USA
Conference Date: 21 September 2000
Page(s): 125 - 128
ISBN (Paper): 0-7803-5868-6
ISSN (Paper): 1080-7725
DOI: 10.1109/AUTEST.2000.885578
Regular:

While superior-quality functional board test has been a goal for most high reliability electronics manufacturers, the time and effort for generating such test programs using today's tools and... View More

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