IEEE - Institute of Electrical and Electronics Engineers, Inc. - Minitomography scanner for agriculture based on dual-energy Compton scattering

Proceedings of SIBGRAPI 2000. 13th Brazilian Symposium on Computer Graphics and Image Processing

Author(s): Cruvinel, P.E. ; Balogun, F.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Gramado, Brazil, Brazil
Conference Date: 17 October 2000
Page(s): 193 - 199
ISBN (Paper): 0-7695-0878-2
ISSN (Paper): 1530-1834
DOI: 10.1109/SIBGRA.2000.883913
Regular:

The paper presents an approach in tomographic instrumentation for agriculture based on dual-energy Compton scattering. The results show a linear relationship, independent of soil aggregate sizes... View More

Advertisement