IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inverse scattering via linear and nonlinear tomography — A review

2000 10th European Signal Processing Conference

Author(s): George A. Tsihrintzis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2000
Conference Location: Tampere, Finland
Conference Date: 4 September 2000
Page(s): 1 - 4
ISBN (Paper): 978-952-1504-43-3
Regular:

Nonlinear tomographic reconstruction algorithms are developed for inversion of data measured in scattering experiments in which the complex phase of the wavefields is modeled by an arbitrarily... View More

Advertisement