IEEE - Institute of Electrical and Electronics Engineers, Inc. - HEMT statistical modeling using Monte Carlo method combined with Principal Components Analysis

Proceedings of 10th Mediterranean Electrotechnical Conference - MELECON 2000

Author(s): Ciminelli, C. ; D'Orazio, A. ; De Sario, M. ; Petruzzelli, V. ; Prudenzano, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Lemesos, Cyprus, Cyprus
Conference Date: 29 May 2000
Volume: 2
ISBN (Paper): 0-7803-6290-X
DOI: 10.1109/MELCON.2000.880056
Regular:

A statistical methodology is presented for the extraction of equivalent circuit arameters (ECP's) of high electron mobility transistors (HEMT). This methodology, based upon the Principal Component... View More

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