IEEE - Institute of Electrical and Electronics Engineers, Inc. - Time interval measurement with application to electronic/optoelectronic circuits and systems

Proceedings of 10th Mediterranean Electrotechnical Conference - MELECON 2000

Author(s): Rogina, B.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Lemesos, Cyprus, Cyprus
Conference Date: 29 May 2000
Volume: 2
ISBN (Paper): 0-7803-6290-X
DOI: 10.1109/MELCON.2000.880039
Regular:

In this paper measurement techniques which can be used for measurement of the nanosecond time intervals in various applications are discussed. We present our time interval measurement set up based... View More

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