IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of Cr content on the interruption ability of CuCr contact materials

Proceedings of 19th International Symposium on Discharge and Electrical Insulation in Vacuum

Author(s): Li, W.P. ; Thomas, R.L. ; Smith, R.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Xi'an, China
Conference Date: 18 September 2000
Volume: 2
ISBN (Paper): 0-7803-5791-4
DOI: 10.1109/DEIV.2000.879007
Regular:

The effects of Cr content in CuCr contact materials, especially on high current interruption, have so far mostly been examined in experimental chambers rather than in actual vacuum interrupters... View More

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