IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dielectric breakdown probabilities for uniform field gap in vacuum

Proceedings of 19th International Symposium on Discharge and Electrical Insulation in Vacuum

Author(s): Shioiri, T. ; Kamikawaji, T. ; Yokokura, K. ; Kaneko, E. ; Ohshima, I. ; Yanabu, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Xi'an, China
Conference Date: 18 September 2000
Volume: 1
ISBN (Paper): 0-7803-5791-4
DOI: 10.1109/DEIV.2000.877238
Regular:

To investigate the reliability of the insulation of equipment having vacuum incorporated as an insulation medium, a study was carried out to clarify breakdown probability distributions in the... View More

Advertisement