IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of a flyback transformer using a stress annealed Finemet nanocrystalline alloy

Proceedings of the 2000 Power Electronics Specialist Conference

Author(s): Costa, F. ; Alves, F. ; Desmoulins, J.B. ; Herisson, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Galway, Ireland, Ireland
Conference Date: 23 June 2000
Volume: 1
ISBN (Paper): 0-7803-5692-6
ISSN (Paper): 0275-9306
DOI: 10.1109/PESC.2000.878865
Regular:

This paper presents experimental results obtained in a flyback converter whose transformer is realized with a stress annealed nanocrystalline (Finemet) material developed by the authors'... View More

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