IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simple computational methods for frequency domain robustness measures

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Paz, R.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 5
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.879189
Regular:

Many robustness measures are computed in the frequency domain, such measures include gain margin, phase margin, Popov and circle criteria, closed-loop resonance peak, and bandwidth. All of these... View More

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