IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robustness analysis of uncertain, nonlinear systems

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Ryali, V. ; Moudaglya, K.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 5
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.879137
Regular:

Based on the notion of positively invariant tubes, we present a simple and novel methodology for quantitative analysis of uncertain nonlinear systems described by a parametrized family of ordinary... View More

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