IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental study of stochastic resonance in atomic force microscopes

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Rajaram, R. ; Salapaka, M.V. ; Basso, M. ; Dahleh, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 3
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.879577
Regular:

Stochastic resonance is an interesting phenomenon which can occur in bistable systems subject to periodic and random forcing. This effect produces an improvement in the sensitivity of the bistable... View More

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