IEEE - Institute of Electrical and Electronics Engineers, Inc. - A model for friction in atomic force microscopy

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Salapaka, S. ; Dahleh, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 3
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.879572
Regular:

A mass-spring-damper model has been presented to describe the cantilever-sample dynamics in an atomic force microscope (AFM). Friction has been incorporated in this model by using... View More

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