IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust batch control of crystallization processes

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Ma, D.L. ; Braatz, R.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 3
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.879499
Regular:

Algorithms are proposed that calculate robust optimal control trajectories for batch and semibatch processes. The algorithms are the first to explicitly take into account both model and control... View More

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