IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using mutual information to pre-process input data for a virtual sensor

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Deignan, P.B., Jr. ; Meckl, P.H. ; Franchek, M. ; Abraham, J. ; Jaliwala, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 4
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.878746
Regular:

Mutual information can be used to determine appropriate input signals and input transformations for a black-box model that represents a virtual sensor. Mutual information is a measure of the... View More

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