IEEE - Institute of Electrical and Electronics Engineers, Inc. - A multi-model approach for detection and isolation of sensor and process faults for a heat exchanger

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Spreitzer, K. ; Balle, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 4
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.878705
Regular:

An approach for model-based fault detection and isolation (FDI) of sensor and process faults for nonlinear processes is presented. The process is decomposed into several sub-processes and for each... View More

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