IEEE - Institute of Electrical and Electronics Engineers, Inc. - A multi-model approach for detection and isolation of sensor and process faults for a heat exchanger
Proceedings of 2000 American Control Conference (ACC 2000)
Author(s): | Spreitzer, K. ; Balle, P. |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2000 |
Conference Location: | Chicago, IL, USA |
Conference Date: | 28 June 2000 |
Volume: | 4 |
ISBN (Paper): | 0-7803-5519-9 |
ISSN (Paper): | 0743-1619 |
DOI: | 10.1109/ACC.2000.878705 |
Regular:
An approach for model-based fault detection and isolation (FDI) of sensor and process faults for nonlinear processes is presented. The process is decomposed into several sub-processes and for each... View More