IEEE - Institute of Electrical and Electronics Engineers, Inc. - A modified PDAF based on a Bayesian detector

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Willett, P. ; Ruixin Niu ; Bar-Shalom, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 4
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.878576
Regular:

Practical detection systems generally are operated using a fixed threshold, optimized to the Neyman-Pearson criterion. An alternative is Bayes detection, in which the threshold varies according to... View More

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