IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust and reduced-order filtering: new characterizations and methods

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Tuan, H.D. ; Apkarian, P. ; Nguyen, T.Q.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 2
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.876716
Regular:

Several challenging problems of robust filtering are addressed in this paper. First of all, for robust filtering problems, we exploit a new LMI (linear matrix inequality) characterization of... View More

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