IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault detection of redundant systems based on B-spline neural network

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Hong Jin ; Chan, C.W. ; Zhang, H.Y. ; Yeung, W.K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 2
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.876693
Regular:

The fault detection and isolation of redundant sensor systems based on B-spline neural networks is presented. The network is trained using an algorithm with an adaptive learning rate. To further... View More

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