IEEE - Institute of Electrical and Electronics Engineers, Inc. - Neural fault detection of an adaptive controlled beam

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Nobrega, E.G. ; Alves, M.A., Jr. ; Grigoriadis, K.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 6
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.877016
Regular:

Model-based observers seem to be the most evolving techniques during the past years, but depending on the complexity of the monitored system, they may become impractical. Non-model-based methods... View More

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