IEEE - Institute of Electrical and Electronics Engineers, Inc. - Probabilistic enhancement of classical robustness margins: a class of nonsymmetric distributions

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Lagoa, C.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 6
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.876933
Regular:

The focal point of this paper is a control system subject to parametric uncertainty. Motivated by recent results in the newly emergent area of probabilistic robustness, we address the problem of... View More

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