IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the use of gap metric for model selection in multilinear model-based control

Proceedings of 2000 American Control Conference (ACC 2000)

Author(s): Galan, O. ; Romagnoli, J.A. ; Arkun, Y. ; Palazoglu, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Chicago, IL, USA
Conference Date: 28 June 2000
Volume: 6
ISBN (Paper): 0-7803-5519-9
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2000.876920
Regular:

One way to design the control of a nonlinear system is to use a set of linear models that are close to the nonlinear system. This gives rise to a need to define the concept of closeness. Since... View More

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