IEEE - Institute of Electrical and Electronics Engineers, Inc. - On test application time and defect detection capabilities of test sets for scan designs

Proceedings 2000 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD 2000

Author(s): Pomeranz, I. ; Reddy, S.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Austin, TX, USA, USA
Conference Date: 17 September 2000
Page(s): 395 - 400
ISBN (Paper): 0-7695-0801-4
ISSN (Paper): 1063-6404
DOI: 10.1109/ICCD.2000.878314
Regular:

The test application time of test sets for scan designs can be reduced (without reducing the fault coverage) by removing some scan operations, and increasing the lengths of the primary input... View More

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