IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scaling of optically thick plume signatures

2000 IEEE Aerospace Conference Proceedings

Author(s): Rudman, S. ; Hibbeln, B.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Big Sky, MT, USA, USA
Conference Date: 25 March 2000
Volume: 3
ISBN (Paper): 0-7803-5846-5
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2000.879854
Regular:

Scaling laws for spectrally resolved infrared source signature from an aircraft or missile exhaust plume in the optically thick carbon dioxide emission region are developed. Using model problems... View More

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