IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of importance sampling and related techniques to measure very high reliability software

2000 IEEE Aerospace Conference Proceedings

Author(s): Hecht, M. ; Hecht, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Big Sky, MT, USA, USA
Conference Date: 25 March 2000
Volume: 4
ISBN (Paper): 0-7803-5846-5
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2000.878464
Regular:

Computer-based control systems have grown more complex over the past two decades. Thus, the software aspects of system reliability are an increasingly important concern. Current methods of... View More

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