IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning envelopes for fault detection and state summarization

2000 IEEE Aerospace Conference Proceedings

Author(s): DeCoste, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Big Sky, MT, USA, USA
Conference Date: 25 March 2000
Volume: 6
ISBN (Paper): 0-7803-5846-5
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2000.877908
Regular:

This paper discusses a data mining approach for overcoming common problems with the traditional red-line limit-checking approach to fault detection and state summarization. It essentially involves... View More

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