IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combining rejection-based pattern classifiers

PeachFuzz 2000. 19th International Conference of the North American Fuzzy Information Processing Society - NAFIPS

Author(s): Mascarilla, L. ; Frelicot, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Atlanta, GA, USA, USA
Conference Date: 13 July 2000
Page(s): 114 - 118
ISBN (Paper): 0-7803-6274-8
DOI: 10.1109/NAFIPS.2000.877400
Regular:

This article deals with the combination of the first stage of two-fold rejection-based classifiers for pattern classification. This Dempster-Shafer's model-based combination uses some relevant... View More

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