IEEE - Institute of Electrical and Electronics Engineers, Inc. - A light spot scanner photo-current technique to measure surface recombination velocity of semiconductor

Proceedings of the 6th International Conference on Properties and Applications of Dielectric Materials

Author(s): Zhang Feng ; Chen Hong Liang ; Xu Chuan Xiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2000
Conference Location: Xi'an, China
Conference Date: 21 June 2000
Volume: 2
ISBN (Paper): 0-7803-5459-1
DOI: 10.1109/ICPADM.2000.876380
Regular:

Depending on the image method and point source approximation method, a physics model was established, and the formula of photo-current versus surface recombination velocity was obtained. Thus, a... View More

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